Cooling Heating Products

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  • Memory Module Tester
  • 128 Para Memory Temperature Test Inspection Equipment

128 Para Memory Temperature Test Inspection Equipment

Memory module -60℃ ◀▶ 125 ℃ temperature tester (patented)

This equipment is capable of performing temperature tests on multiple channels of memory semiconductors. It is usually supplied in 128 Para and 256 Para. It guarantees 2 years of durability and is operated without accidents for 3 years in the field. Cooling water, CDA's utility is required to run this equipment.

Improvement compared to other equipment

Improvement items Details commercial SYSTEM in Market Futrotech Co., Ltd. Remarks
Test time shorten (minute) 1 Cycle Time 14.4 (minute) 8.11 (minute) +25 ℃ ▶ 105 ℃
105 ℃ ▶ 85 ℃
+85℃ ▶ -25 ℃
-25℃ ▶ -40 ℃
-40 ℃ ▶ 25 ℃
Minimum temperature improvement low temperature max implementation temperature -40℃ -55℃ -15 ℃ improvement
Improvement of power consumption power consumption 24.2 14.75 Kwh
24 hours a day operation 581 354 power cost 100 won/Kwh applied
1 month operation 17,424 10,620
1 year uptime 209,088 127,440
1 year electricity cost 20,908,800 12,744,000 annual electricity cost 8.16 million won savings.
high temperature uniformity
Uniform temperature control for each channel
Miniature temperature controller and maximum low-temperature realization temperature
UI for PC